The use of rigid copper oxide tips makes high-resolution molecular imaging by non-contact atomic force microscopy more reliable.
Access options
Subscribe to Journal
Get full journal access for 1 year
$187.00
only $15.58 per issue
All prices are NET prices.
VAT will be added later in the checkout.
Rent or Buy article
Get time limited or full article access on ReadCube.
from$8.99
All prices are NET prices.
References
- 1.
Gross, L., Mohn, F., Moll, N., Liljeroth, P. & Meyer, G. Science 325, 1110–1114 (2009).
- 2.
Hapala, P. et al. Phys. Rev. B 90, 085421 (2014).
- 3.
Mönig, H. et al. Nat. Nanotech. https://doi.org/10.1038/s41565-018-0104-4 (2018).
- 4.
Gross, L. et al. Science 337, 1326–1329 (2012).
- 5.
Mohn, F., Gross, L., Moll, N. & Meyer, G. Nat. Nanotech. 7, 227–231 (2012).
- 6.
Hapala, P. et al. Nat. Commun. 7, 11560 (2016).
- 7.
Boneschanscher, M. P., Hämäläinen, S. K., Liljeroth, P. & Swart, I. ACS Nano 8, 3006–3014 (2014).
- 8.
Pavliček, N. et al. Phys. Rev. Lett. 108, 86101 (2012).
- 9.
Zhang, J. et al. Science 342, 611–614 (2013).
Author information
Affiliations
Debye Institute for Nanomaterials Science, Utrecht University, Utrecht, The Netherlands
- Ingmar Swart
Authors
Search for Ingmar Swart in:
Corresponding author
Correspondence to Ingmar Swart.
Rights and permissions
To obtain permission to re-use content from this article visit RightsLink.
