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TWISTED GRAPHENE

Magic under the microscope

Four-dimensional scanning transmission electron microscopy is demonstrated to be a powerful technique for interrogating local strain of twisted graphene bilayers, revealing a two-regime lattice reconstruction process below the ‘magic’ angle.

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Fig. 1: Atomic rearrangement.

panels a and b reproduced with permission from ref. 6, Springer Nature Ltd.

Fig. 2: Probing local strain.

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Correspondence to S. J. Haigh.

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Haigh, S.J., Gorbachev, R. Magic under the microscope. Nat. Mater. 20, 908–909 (2021). https://doi.org/10.1038/s41563-021-01027-x

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