In situ probing electrified interfacial water structures at atomically flat surfaces

Abstract

Solid/liquid interfaces are ubiquitous in nature and knowledge of their atomic-level structure is essential in elucidating many phenomena in chemistry, physics, materials science and Earth science1. In electrochemistry, in particular, the detailed structure of interfacial water, such as the orientation and hydrogen-bonding network in electric double layers under bias potentials, has a significant impact on the electrochemical performances of electrode materials2,3,4. To elucidate the structures of electric double layers at electrochemical interfaces, we combine in situ Raman spectroscopy and ab initio molecular dynamics and distinguish two structural transitions of interfacial water at electrified Au single-crystal electrode surfaces. Towards negative potentials, the interfacial water molecules evolve from structurally ‘parallel’ to ‘one-H-down’ and then to ‘two-H-down’. Concurrently, the number of hydrogen bonds in the interfacial water also undergoes two transitions. Our findings shed light on the fundamental understanding of electric double layers and electrochemical processes at the interfaces.

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Fig. 1: Probing interfacial water on Au single-crystal electrode surfaces.
Fig. 2: Vibrational spectra of interfacial water at Au single-crystal electrode surfaces.
Fig. 3: Potential dependence of the interfacial water structure at the electrified Au(111) surface from AIMD simulations.
Fig. 4: Potential-dependent evolution of the hydrogen-bond network of interfacial water.

Data availability

The data that support the findings of this study are available from the corresponding author on reasonable request.

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Acknowledgements

The authors thank J.W. Yan and S. Liu for helpful discussions. Funding was provdied by the National Natural Science Foundation of China (grants nos. 21373166, 21775127, 21861132015, 21522508, 21521004, 21427813, 21321062, 21621091 and 21533006).

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J.F.L., J.C., C.Y.L. and J.B.L. conceived and designed the project, analysed the results and wrote the manuscript. C.Y.L., Y.H.W., Z.Q.T. and J.F.L. carried out the experiments and analysed the data. J.B.L. and J.C. performed the AIMD calculations. Z.L.Y. and S.C. contributed to FDTD simulations.

Corresponding authors

Correspondence to Jian-Feng Li or Jun Cheng.

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Supplementary Information

Supplementary materials and methods, Supplementary Figs. 1–8, Supplementary refs. 1–16

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Li, C., Le, J., Wang, Y. et al. In situ probing electrified interfacial water structures at atomically flat surfaces . Nat. Mater. 18, 697–701 (2019). https://doi.org/10.1038/s41563-019-0356-x

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