Fig. 6 | Nature Communications

Fig. 6

From: Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits

Fig. 6

Comparison of lifetime measurement techniques. Extracted carrier lifetimes as a function of temperature for time-resolved microwave reflectance (TMR) on as-grown InAsSb (orange), time-resolved photoluminescence (TRPL) on as-grown InAsSb using InSb (cyan) and mercury cadmium telluride (MCT) (light blue) detectors, TRPL from pixel array using MCT detector (blue), and single-pixel µ-TRMRR (red) techniques. TRPL (InSb), TMR, and μ-TRMRR agree well, but as shown, when using a less sensitive detector (such as MCT), the TRPL signal falls beneath the noise floor before the low-injection condition is satisfied, preventing an accurate lifetime extraction

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