Fig. 1 | Nature Communications

Fig. 1

From: High-velocity projectile impact induced 9R phase in ultrafine-grained aluminium

Fig. 1

Microstructures of as-deposited ultrafine grained (UFG) Al thin film. a EBSD micrograph showing orientation map along the sample surface normal direction; the red lines indicate ∑3 twin boundaries. Scale bar, 1 µm. b The boundary rotation axis (BRA) map reveals the incoherent twin boundary (ITB) (when BRA//TB) and coherent twin boundary (CTB) (when BRATB). Scale bar, 1 µm. c, d Plan-view TEM images showing growth twins in as-deposited UFG Al thin films (inset of d shows the selected area diffraction (SAD) pattern of a grain containing growth twins). Scale bar, 20 nm

Back to article page