Fig. 1: XRD and TEM analysis | NPG Asia Materials

Fig. 1: XRD and TEM analysis

From: Huge magnetoresistance and ultrasharp metamagnetic transition in polycrystalline Sm0.5Ca0.25Sr0.25MnO3

Fig. 1

a, b show the profile fitting of the room temperature (RT) and low temperature (15 K) XRD data using Pnma and (Pnma + P21/m) space groups. The insets of a and b show the fitting of the peaks at 2θ = 47.5°, where a new monoclinic phase (P21/m) appears at low temperature. c displays the evolution of the new peak of the P21/m space group with temperature. d shows the XRD linewidth modification in the presence of a zero magnetic field and a 70 kOe magnetic field and after removing the field. e displays typical (100) zone axis ED patterns at room temperature. The pattern was indexed using an orthorhombic structure (Pnma). f demonstrates a (001) bright-field image recorded at 100 K during TEM measurements. For HRTEM analysis, please see Supplementary section I(B)

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