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Integrated photonics

Device-level photonic testing

Nature Photonics volume 9, pages 8–9 (2015)Cite this article

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Non-invasive, multispectral characterization of integrated photonic circuits paves the way towards optical methodologies ready for industrial applications.

Ever since Marconi's first radio experiments in 1894, electromagnetic waves have been used to carry information over long distances. The introduction of fibre optics confined this radiation to a small structure and allowed its flow to be precisely controlled over both short and long distances. However, signals currently need to be converted from the optical to electronic domain for signal processing — with substantial costs in terms of energy dissipation and speed.

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Figure 1: Schematic of the ultrafast photomodulation spectroscopy set-up employed by Bruck et al.1

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Authors and Affiliations

  1. Matteo Burresi is at Istituto Nazionale di Ottica (CNR-INO), Largo Fermi 6, 50125 Firenze (FI), Italy and also at the European Laboratory for Non-linear Spectroscopy (LENS), 50019 Sesto Fiorentino (FI), Italy,

    Matteo Burresi

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  1. Matteo Burresi
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Correspondence to Matteo Burresi.

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Burresi, M. Device-level photonic testing. Nature Photon 9, 8–9 (2015). https://doi.org/10.1038/nphoton.2014.313

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