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Integrated photonics

Device-level photonic testing

Non-invasive, multispectral characterization of integrated photonic circuits paves the way towards optical methodologies ready for industrial applications.

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Figure 1: Schematic of the ultrafast photomodulation spectroscopy set-up employed by Bruck et al.1

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Correspondence to Matteo Burresi.

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Burresi, M. Device-level photonic testing. Nature Photon 9, 8–9 (2015). https://doi.org/10.1038/nphoton.2014.313

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