News & Views | Published:

Integrated photonics

Device-level photonic testing

Nature Photonics volume 9, pages 89 (2015) | Download Citation

Non-invasive, multispectral characterization of integrated photonic circuits paves the way towards optical methodologies ready for industrial applications.

Access optionsAccess options

Rent or Buy article

Get time limited or full article access on ReadCube.

from$8.99

All prices are NET prices.

References

  1. 1.

    et al. Nature Photon. 9, 54–60 (2015).

  2. 2.

    et al. Opt. Mater. Express 3, 1313–1331 (2013).

  3. 3.

    Silicon 2, 1–6 (2010).

  4. 4.

    & Integrated Photonics (Springer Science & Business Media, 2003).

  5. 5.

    et al. Nano Lett. 8, 2872–2877 (2008).

  6. 6.

    et al. Nature Photon. 8, 474–481 (2014).

  7. 7.

    et al. Science 338, 1317–1321 (2012).

  8. 8.

    , & Opt. Express 14, 10588–10595 (2006).

  9. 9.

    et al. Nature Phys. 3, 401–405 (2007).

  10. 10.

    , , , & Opt. Lett. 36, 1827–1829 (2011).

Download references

Author information

Affiliations

  1. Matteo Burresi is at Istituto Nazionale di Ottica (CNR-INO), Largo Fermi 6, 50125 Firenze (FI), Italy and also at the European Laboratory for Non-linear Spectroscopy (LENS), 50019 Sesto Fiorentino (FI), Italy

    • Matteo Burresi

Authors

  1. Search for Matteo Burresi in:

Corresponding author

Correspondence to Matteo Burresi.

About this article

Publication history

Published

DOI

https://doi.org/10.1038/nphoton.2014.313

Newsletter Get the most important science stories of the day, free in your inbox. Sign up for Nature Briefing