Abstract
The detection of photons emitted from single quantum objects is highly desirable for the diagnosis of nanoscale devices using microscopes. An extremely tiny probe (∼0.1 nm) with high current recently became available for aberration-corrected scanning transmission electron microscopy, and it is possible for individual atoms in nanoscale devices to be excited using such a highly focused probe1,2,3. Here, we demonstrate the successful detection of characteristic X-ray signals from single erbium atoms using energy-dispersive X-ray spectroscopy. The intensities of the erbium L and M lines from a single erbium atom were extremely weak in comparison to the N edge of electron energy-loss spectroscopy, demonstrating the intrinsic difficulty in sensing single atoms using X-ray spectroscopy. Nevertheless, this work will certainly help in the advance towards obtaining X-ray spectra from single atoms and to evaluate the fluorescence yield on a single-atom basis.
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References
- 1
Suenaga, K. et al. Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage. Nature Chem. 1, 415–418 (2009).
- 2
Krivanek, O. et al. Ultramicroscopy 110, 935–945 (2010).
- 3
Suenaga, K. & Koshino, M. Atom-by-atom spectroscopy at graphene edge. Nature 468, 1088–1090 (2010).
- 4
Suenaga, K. et al. Element-selective single atom imaging. Science 290, 2280–2282 (2000).
- 5
Varela, M. et al. Spectroscopic imaging of single atoms within a bulk solid. Phys. Rev. Lett. 92, 095502 (2004).
- 6
Egerton, R. in Electron Energy-Loss Spectroscopy in the Electron Microscope 3rd edn (Springer, 2011).
- 7
Muller, D. & Silcox, J. Delocalization in elastic scattering. Ultramicroscopy 59, 195–213 (1995).
- 8
Suenaga, K., Iizumi, Y. & Okazaki, T. Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM. Euro. Phys. J. 54, 033508 (2011).
- 9
Watanabe, M. in Scanning Transmission Electron Microscopy, Imaging and Analysis (Pennycook, S. J. & Nellist, P. D. eds) Ch. 7, 291–351 (Springer, 2011).
- 10
Krause, M & Oliver, J. Natural widths of atomic K and L lines. J. Phys. Chem. Ref. Data 8, 329–338 (1979).
- 11
Chu, M.-W., Liou, S. C., Chang, C. P., Choa, F.-S. & Chen, C. H. Emergent chemical mapping at atomic-column resolution by energy-dispersive X-ray spectroscopy in an aberration-corrected electron microscope. Phys. Rev. Lett. 104, 196101 (2010).
- 12
Watanabe, M., Kanno, M. & Okunishi, E. Atomic-resolution elemental mapping by EELS and XEDS in aberration corrected STEM. JEOL News 45, 8–15 (2010).
- 13
d'Alfonso, A. J., Freitag, B., Klenov, D. & Allen, L. J. Atomic-resolution chemical mapping using energy-dispersive X-ray spectroscopy. Phys. Rev. B 81, 100101 (2010).
- 14
Terauchi, M. et al. Ultrasoft-X-ray emission spectroscopy using a newly designed wavelength-dispersive spectrometer attached to a transmission electron microscope. J. Electron Microsc. 61, 1–8 (2012).
- 15
Zagonel, L. et al. Nanometer scale spectral imaging of quantum emitters in nanowires and its correlation to their atomically resolved structure. Nano Lett. 11, 568–573 (2011).
- 16
Lovejoy, T. C. et al. Single atom identification by energy dispersive X-ray spectroscopy. Appl. Phys. Lett. 100, 154101 (2012).
Acknowledgements
This work was supported in part by the Nanotechnology Network Japan programme, sponsored by MEXT, the Japanese Government. The authors thank K. Kimoto for his valuable comment regarding cross-section calculations. The authors also thank Y. Iizumi and Y. Niimi for their help with specimen preparation. Thanks also go to one of the reviewers for an extended analysis of the displayed data as well as positive suggestions. K.S. acknowledges support from a Grant-in-Aid for Scientific Research from MEXT (no. 19054017) and the JST Research Acceleration programme.
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K.S. and S.M. conceived and designed the experiment. T.O. prepared the materials and S.M. contributed the apparatus. E.O. and K.S. performed the experiment. K.S. analysed the data and wrote the manuscript. All authors commented on the final manuscript.
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Suenaga, K., Okazaki, T., Okunishi, E. et al. Detection of photons emitted from single erbium atoms in energy-dispersive X-ray spectroscopy. Nature Photon 6, 545–548 (2012). https://doi.org/10.1038/nphoton.2012.148
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