By making use of polarization control, researchers have achieved a record 100-nm resolution when imaging buried transistors in an integrated circuit.
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References
Serrels, K. A. et al. Nature Photon. 2, 311–314 (2008).
Xu, C. & Denk, W. J. Appl. Phys. 86, 2226–2231 (1999).
Novotny, L. & Hecht, B. Principles of Nano-Optics (Cambridge Univ. Press, Cambridge, 2006).
Mansfield, S. M. & Kino, G. S. Appl. Phys. Lett. 57, 2615–2616 (1990).
Ramsay, E. et al. Appl. Phys. Lett. 90, 131101 (2007).
Abouraddy, A. F. & Toussaint, K. C. Phys. Rev. Lett. 96, 153901 (2006).
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Ippolito, S. Polarized high-resolution imaging. Nature Photon 2, 273–274 (2008). https://doi.org/10.1038/nphoton.2008.61
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DOI: https://doi.org/10.1038/nphoton.2008.61
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