I introduce an algorithm for subpixel localization of imaged objects based on an analytic, non-iterative calculation of the best-fit radial symmetry center. This approach yields tracking accuracies that are near theoretical limits, similarly to Gaussian fitting, but with orders-of-magnitude faster execution time, lower sensitivity to nearby particles and applicability to any radially symmetric intensity distribution. I demonstrate the method with several types of data, including super-resolution microscopy images.
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I thank H. Deberg, W. Draper, G. Hunter, J. Liphardt, P. Lu, P. Selvin, M. Tjioe, E. Weeks and D. Weitz for sharing and discussing experimental data, and E. Corwin and D. Grier for comments and discussions. This work is supported by the US National Science Foundation (award numbers 0746038 and 1006171).
The author declares no competing financial interests.
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Parthasarathy, R. Rapid, accurate particle tracking by calculation of radial symmetry centers. Nat Methods 9, 724–726 (2012). https://doi.org/10.1038/nmeth.2071
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