Figure 1 : Overview of the sample topographic and electronic structure.

From: Electrical resistance of individual defects at a topological insulator surface

Figure 1

(a) STM image of the sample surface, showing that screw dislocations and QL steps are the dominant features. Scale bar, 200 nm. (b) ARPES measurement of the same sample along direction (in-plane, corresponding to ). The Fermi energy is indicated by the solid white line. The Dirac cone of the TSS is indicated by dashed red lines intersecting at the Dirac point just above the valence band edge (solid red curve).