Figure 5: Time-of-flight secondary-ion-mass spectrometry (ToF-SIMS) depth profiling. | Nature Communications

Figure 5: Time-of-flight secondary-ion-mass spectrometry (ToF-SIMS) depth profiling.

From: Photo-induced halide redistribution in organic–inorganic perovskite films

Figure 5

(a) Schematic of photon dose-dependent experiment indicating the regions exposed to 1.2 kJ cm−2 (red dotted circle) and 2.4 kJ cm−2 (green dotted circle) (b) ToF-SIMS image of the iodide (I) intensity distribution summed through the film depth (the image has been adjusted to show maximum contrast) after local exposure to the photon doses shown in a, scale bar, 5 μm. (c) Depth profile data of the iodide intensity in regions of interest (ROI) relative to the background (IROI–Ibackground) for regions illuminated in a, with the carrier generation (gen.) rate plotted on the right axis. (d) Depth profile data for ROI’s adjacent to 1.2 kJ cm−2 (pink) and 2.4 kJ cm−2 (gold) illumination areas compared with a background level (blue circle). All selected regions contained the same number of pixels to allow comparison.

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