Extended Data Figure 1 : X-ray diffraction characterization of the (LuFeO3)m/(LuFe2O4)n superlattices.

From: Atomically engineered ferroic layers yield a room-temperature magnetoelectric multiferroic

Extended Data Figure 1

a, θ–2θ XRD scans for the (LuFeO3)m/(LuFe2O4)n films for which either n or m is equal to 1. The composition is labelled (m-n) on the right. The asterisk (*) indicates the 111 XRD peak from the (111) YSZ substrate. b, Rocking-curve XRD scan of the 005 film peak of the (LuFeO3)1/(LuFe2O4)1 film (blue) compared with the 111 peak of the YSZ substrate (black). FWHM, full-width at half-maximum.