Abstract
One of the biggest obstacles in improving the resolution of the electron microscope has always been the blurring of the image caused by lens aberrations. Here we report a solution to this problem for a medium-voltage electron microscope which gives a stunning enhancement of image quality.
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Haider, M., Uhlemann, S., Schwan, E. et al. Electron microscopy image enhanced. Nature 392, 768–769 (1998). https://doi.org/10.1038/33823
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DOI: https://doi.org/10.1038/33823
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