Abstract
The observation of Bragg diffraction from supernanometre regions of 'amorphous' silicon reveals the existence of crystalline clusters too small to be observed by X-ray diffraction in bulk. The clusters are imaged by high-resolution transmission electron microscopy. These observations support a submicrocrystalline model for the structure of non-crystalline solids.
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Phillips, J., Bean, J., Wilson, B. et al. Bragg diffraction by amorphous silicon. Nature 325, 121–125 (1987). https://doi.org/10.1038/325121a0
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DOI: https://doi.org/10.1038/325121a0
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