Seeing order in ‘amorphous’ materials

Abstract

Careful analysis of high resolution electron micrographs of amorphous materials, making use of a simple optical simulation technique, provides a means for discriminating between ‘meaningful’ and ‘meaningless’ images, and for detecting ordered regions as small as 15 Å in the ‘meaningful’ ones. Such regions, comprising only about 100 atoms, have been directly observed in ‘amorphous’ carbon, and it is possible that they exist in a range of other ‘amorphous’ materials.

Access optionsAccess options

Rent or Buy article

Get time limited or full article access on ReadCube.

from$8.99

All prices are NET prices.

References

  1. 1

    Sieber, P., and Tonar, K., Optik, 42, 375–380 (1975).

  2. 2

    Crewe, A. V., Science, 168, 1338–1340 (1970).

  3. 3

    Hashimoto, H., Kumao, A., Hino, K., Yotsumo, H., and Ono, A., Jap. J. appl. Phys., 10, 1115–1116 (1971).

  4. 4

    Crewe, A. V., Langmore, J., Isaacson, M., and Retsky, M., Proc. 8th Int. EM Congr. (Canberra), 1, 260–261 (1974).

  5. 5

    Ban, L. L., and Hess, W. M., Proc. 26th EMSA Meeting, 256–257 (1968).

  6. 6

    Ban, L. L., Surface and Defect Properties of Solids, 1, 54–94 (The Chemical Society, London, 1972).

  7. 7

    Rudee, M. L., Phys. stat. solidi (b), 46, K1–K3 (1971).

  8. 8

    Chaudhari, P., Graczyk, J. F., and Herd, S. R., Phys. stat. solidi (b), 51, 801–820 (1972).

  9. 9

    Howie, A., Krivanek, O. L., and Rudee, M. L., Phil. Mag., 27, 235–255 (1973).

  10. 10

    Herd, S. R., and Chaudhari, P., Phys. stat. solidi (a), 26, 627–642 (1974).

  11. 11

    Rudee, M. L., and Howie, A., Phil. Mag., 25, 1001–1007 (1972).

  12. 12

    Gaskell, P. H., and Howie, A., Proc. 12th Int. Semicond. Conf. (Stuttgart), 1076–1080 (1974).

  13. 13

    Polk, D. E., J. Non-Cryst. Sol., 5, 365–376 (1971).

  14. 14

    Polk, D. E., and Boudreaux, D. S., Phys. Rev. Lett., 31, 92–95 (1973).

  15. 15

    Berry, M. V., and Doyle, P. A., J. Phys. C., 6, L6–L9 (1973).

  16. 16

    Krivanek, O. L., and Howie, A., J. appl. Crystallogr., 8, 213–219 (1975).

  17. 17

    Krivanek, O. L. thesis, Univ. Cambridge (1975).

  18. 18

    Fry, T. C., Probability and its Engineering Uses (Van Nostrand, Princeton, 1965).

  19. 19

    Rice, S. O., Bell Syst. tech. J., 23, 282–332 (1944); ibid., 24, 46–156 (1945).

  20. 20

    Longuet-Higgins, M. S., Phil. Trans. R. Soc., A 249, 321–387 (1956); ibid., A 250 157–174 (1957).

  21. 21

    Dainty, J. C., Opt. Acta, 17, 761–772 (1970).

Download references

Author information

Rights and permissions

Reprints and Permissions

About this article

Further reading

Comments

By submitting a comment you agree to abide by our Terms and Community Guidelines. If you find something abusive or that does not comply with our terms or guidelines please flag it as inappropriate.