Letter | Published:

Measurement of the Lattice Parameter of Silicon, using a Double-diffraction Effect

Nature 212, 173–175 (1966) | Download Citation

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Abstract

PRECISION measurements of the lattice parameters of single crystals have been made both by measuring directly the angles of Bragg reflexion1, and by analysing the Kossel, or divergent beam, patterns produced by a point source of X-rays2. The angles between the Bragg cones or their intersections are determined by the ratio . Lonsdale3 has shown that when these angles are very small, as for example when a number of Bragg cones almost intersect at a point, high precision can be achieved using relatively modest apparatus. By recording part of the Kossel pattern of diamond at a distance of 1 metre she obtained a very accurate value of the lattice parameter.

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References

  1. 1

    Bond, W. L., Acta Cryst., 13, 814 (1960).

  2. 2

    Kossel, W., Ann. der Phys., 25, 512 (1936).

  3. 3

    Lonsdale, K., Phil. Trans. Roy. Soc., A, 240, 219 (1947).

  4. 4

    Renninger, M., Z. fur Phys., 106, 172 (1937).

  5. 5

    James, R. W., The Optical Principles of the Diffraction of X-Rays (G. Bell and Sons, London, 1958).

    • 6

      Isherwood, B. J., and Wallace, C. A. (to be published).

      • 7

        Parrish, W., Acta Cryst., 13, 838 (1960).

      • 8

        King, H. W., and Russell, C. M., Advances in X-Ray Analysis, 8, 1 (1965).

      • 9

        Franks, A., see footnote in ref. 8.

        • 10

          Straumanis, M. E., Borgeaud, P., and James, W. L., J. App. Phys., 32, 1382 (1961).

        • 11

          Batchelder, D. N., and Simmons, R. O., J. Chem. Phys., 41, 2324 (1964).

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        Affiliations

        1. The General Electric Company Limited, Central Research Laboratories, Hirst Research Centre, Wembley, England

          • B. J. ISHERWOOD
          •  & C. A. WALLACE

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        https://doi.org/10.1038/212173a0

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