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Measurement of the Lattice Parameter of Silicon, using a Double-diffraction Effect

Nature volume 212, pages 173–175 (1966)Cite this article

Abstract

PRECISION measurements of the lattice parameters of single crystals have been made both by measuring directly the angles of Bragg reflexion1, and by analysing the Kossel, or divergent beam, patterns produced by a point source of X-rays2. The angles between the Bragg cones or their intersections are determined by the ratio . Lonsdale3 has shown that when these angles are very small, as for example when a number of Bragg cones almost intersect at a point, high precision can be achieved using relatively modest apparatus. By recording part of the Kossel pattern of diamond at a distance of 1 metre she obtained a very accurate value of the lattice parameter.

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Authors and Affiliations

  1. The General Electric Company Limited, Central Research Laboratories, Hirst Research Centre, Wembley, England

    B. J. ISHERWOOD & C. A. WALLACE

Authors
  1. B. J. ISHERWOOD
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  2. C. A. WALLACE
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ISHERWOOD, B., WALLACE, C. Measurement of the Lattice Parameter of Silicon, using a Double-diffraction Effect. Nature 212, 173–175 (1966). https://doi.org/10.1038/212173a0

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