Contrast in Electron Micrographs using Two Opposed Electron Beams


TRANSMISSION electron microscopy and electron-probe X-ray microanalysis are two well-established methods of micro-investigation. The two functions may be combined in one instrument by using two electron guns connected to a single high-voltage source and with beams in opposition. One electron gun is used to illuminate the specimen and further lenses produce a magnified image on a fluorescent screen. The second electron gun produces a beam that emerges through a hole in the fluorescent screen and passes through the electron lenses in the opposite direction so that the electron source is demagnified by the same amount that the image of the specimen is magnified. Further details are given elsewhere1,2.

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  1. 1

    Buchanan, R., and Nixon, W. C., Proc. Stanford Conf. X-ray Optics and X-ray Microanalysis, Aug. 1962 (Academic Press, 1963).

  2. 2

    Buchanan, R., thesis, Cambridge University (1964).

  3. 3

    Buchanan, R., and Nixon, W. C., Proc. Third European Regional Conf. Elect. Microscopy, Prague 1964.

  4. 4

    Muller, G., and Meyerhoff, K., Nature, 201, 590 (1964).

  5. 5

    Dove, D. B., J. Appl. Phys., 35, 1652 (1964).

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NIXON, W., BUCHANAN, R. Contrast in Electron Micrographs using Two Opposed Electron Beams. Nature 206, 1037 (1965).

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