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Naturevolume 199page946 (1963) | Download Citation

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Semiconductor Reliability

Edited by John E. Shwop and Harold J. Sullivan. Pp. ix + 309. (Elizabeth, N.J.: Engineering Publishers, 1961. Distributed by Reinhold Publishing Corporation, New York; and Chapman and Hall, Ltd., London.) 68s. net.

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https://doi.org/10.1038/199946b0

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