Isotopic Analysis of Silicon by Solid-Source Mass Spectrometry using Negative Ions

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Abstract

AN A.E.I. mass spectrometer, type M.S.2/S., fitted with an electron multiplier and having a triple tungsten filament as source for the thermal ionization of solids is being used for measurements of the abundance of silicon isotopes.

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NEWTON, D., SANDERS, J. & TYRRELL, A. Isotopic Analysis of Silicon by Solid-Source Mass Spectrometry using Negative Ions. Nature 187, 683 (1960) doi:10.1038/187683a0

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