Abstract
IN a previous communication1, a radioactivation method for the determination of arsenic in ‘high purity’ silicon was outlined. Further work on trace impurities in this element has resulted in the development of a technique for estimating submicrogram quantities of phosphorus.
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References
James, J. A., and Richards, D. H., Nature, 175, 769 (1955).
Lundell, Hoffman and Bright, “Chemical Analysis of Iron and Steel”, 218 (Wiley, 1931).
Burton, J. A., Physica, 20, 845 (1954).
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JAMES, J., RICHARDS, D. Radioactivation Analysis of Phosphorus in Silicon. Nature 176, 1026 (1955). https://doi.org/10.1038/1761026a0
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DOI: https://doi.org/10.1038/1761026a0
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