Abstract
IN the course of some experiments with thin rhodium films, I noticed that the intensity of light reflected from a rhodiumized glass–air interface is much less than that reflected from the same interface when used in the air–glass sense. Sheared wave-front interferometric study of the edge of such a film indicated that this may be primarily due to a half-wave phase shift which can be seen at the glass–air boundary, but not when the same boundary is air–glass, the out-of-phase condition reducing the reflective intensity.
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SMITH, F. Thin Metallic Films for Anti-Reflexion Coatings on Dielectric–Air Interfaces. Nature 172, 462 (1953). https://doi.org/10.1038/172462a0
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DOI: https://doi.org/10.1038/172462a0
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