Letter | Published:

Measurement of Thickness of Thin Films

Nature volume 158, page 621 (02 November 1946) | Download Citation

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Abstract

TOLANSKY has shown in a recent series of papers1 that interference fringes formed by multiple reflexion between highly reflecting surfaces can be applied with great effectiveness to the study of surface topography. Thus Tolansky has been able to detect abrupt changes of only 20 A. in level in cleavage surfaces of mica. We have recently applied this technique to the determination of thickness of thin layers of gold, silica, collodion and ‘Formvar’, which are widely used for supporting and other purposes in electron microscopy.

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References

  1. 1.

    , Proc. Roy. Soc., 184, 41 (1945); 186, 261 (1946) and earlier papers.

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Affiliations

  1. High Voltage Laboratories, Metropolitan-Vickers Electrical Co., Manchester.

    • A. F. GUNN
    •  & R. A. SCOTT

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DOI

https://doi.org/10.1038/158621a0

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