Determination of Absolute from Relative X-Ray Intensity Data

Abstract

IN the 'absolute measurements' of X-ray intensities of reflexions from a crystal, a measurement must be made of the monochromatic radiation incident upon the crystal in one second¹, which, though it can be done fairly conveniently by the ionization chamber method², requires a complicated design of apparatus in the use of the rotation photographic method. I have considered the problem in the light of a new synthesis of X-ray data³ and found that the absolute values of |F (h)| ² may be deduced to a close approximation from the relative intensity data without any further experimental work. The derivation of the equations needed in this deduction in the case of a linear crystal is shown below.