Letter | Published:

A New Type of ‘X-Ray Microscope’

Nature volume 143, page 678 (22 April 1939) | Download Citation

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Abstract

A STANDARD method of X-ray analysis consists in measuring the strength of the diffracted beams corresponding to a series of reflections around a crystal zone (for example, the reflections with indices hol around the b axis), and then forming a double Fourier series with the amplitudes F as coefficients.

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References

  1. 1.

    Z. Krist., 69, 168 (1928).

  2. 2.

    Z. Krist., 70, 475 (1929).

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Author information

Affiliations

  1. Cavendish Laboratory, Cambridge.

    • W. L. BRAGG

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DOI

https://doi.org/10.1038/143678a0

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