Abstract
A STANDARD method of X-ray analysis consists in measuring the strength of the diffracted beams corresponding to a series of reflections around a crystal zone (for example, the reflections with indices hol around the b axis), and then forming a double Fourier series with the amplitudes F as coefficients.
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BRAGG, W. A New Type of ‘X-Ray Microscope’. Nature 143, 678 (1939). https://doi.org/10.1038/143678a0
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DOI: https://doi.org/10.1038/143678a0
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