Atomic force microscopy

Atomic force microscopy (AFM), a form of scanning probe microscopy, is a technique where a cantilever with a sharp tip is systematically scanned across a sample (biological or material) surface to produce a nanometre-resolution topographic map. AFM can also be used to measure forces between the tip and sample.

Latest Research and Reviews

News and Comment

  • Research Highlights |

    A new development in high-speed atomic force microscopy enables microsecond resolution.

    • Katarzyna M. Marcinkiewicz
  • Research Highlights |

    The resolution of AFM images is highly sensitive to the atomic composition and structure of the tip. Harry Mönig and co-workers show that an oxygen-terminated copper tip can enable imaging at unprecedented resolution, allowing us to study molecular interactions in exquisite detail.

    • Gabriella Graziano
  • News and Views |

    Atomic force microscopy is used to measure reorganization energies upon charging individual molecules adsorbed on insulators.

    • Alexander L. Shluger
    •  & Peter Grutter
    Nature Nanotechnology 13, 360-361
  • News and Views |

    The use of rigid copper oxide tips makes high-resolution molecular imaging by non-contact atomic force microscopy more reliable.

    • Ingmar Swart
    Nature Nanotechnology 13, 358-359
  • News and Views |

    Understanding interfacial charge transfer in water-splitting photoelectrodes is complicated by the delicate interplay between catalyst and light absorber. Now, an approach based on atomic force microscopy is exploited to measure the surface electrochemical potential of nanostructured catalyst-coated electrodes in operando.

    • Francesca Maria Toma
    Nature Energy 3, 6-7