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Scanned-Probe Microscopes

By examining a surface at very close range with a probe that may be just a single atom across, they can resolve features and properties on a scale that eludes other microscopes

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Scientific American Magazine Vol 261 Issue 4This article was originally published with the title “Scanned-Probe Microscopes” in Scientific American Magazine Vol. 261 No. 4 (), p. 98
doi:10.1038/scientificamerican1089-98