News and Views
Nature Nanotechnology 2, 461 - 462 (2007)
Published online: 29 July 2007 | doi:10.1038/nnano.2007.233
Subject Categories: Nanometrology and instrumentation | Surface patterning and imaging
Atomic force microscopy: Getting a feeling for the nanoworld
Robert W. Stark1
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Robert W. Stark is in the Department of Earth and Environmental Sciences, Ludwig-Maximilians-Universität Munich, 80333 Munich, Germany.
e-mail: stark@lmu.de
Abstract
Nanoindentation probes can map the mechanical properties of surfaces and films with high resolution, but they are much slower than probes that image the topography. Now, a new atomic force microscopy technique can capture both pictures at once.
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