Abstract
The ability to detect light over a broad spectral range is central to practical optoelectronic applications and has been successfully demonstrated with photodetectors of two-dimensional layered crystals such as graphene and MoS2. However, polarization sensitivity within such a photodetector remains elusive. Here, we demonstrate a broadband photodetector using a layered black phosphorus transistor that is polarization-sensitive over a bandwidth from ∼400 nm to 3,750 nm. The polarization sensitivity is due to the strong intrinsic linear dichroism, which arises from the in-plane optical anisotropy of this material. In this transistor geometry, a perpendicular built-in electric field induced by gating can spatially separate the photogenerated electrons and holes in the channel, effectively reducing their recombination rate and thus enhancing the performance for linear dichroism photodetection. The use of anisotropic layered black phosphorus in polarization-sensitive photodetection might provide new functionalities in novel optical and optoelectronic device applications.
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Acknowledgements
This work was supported by the Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering (contract no. DE-AC02-76SF00515). X.L., F.A., A.G.C. and M.L.B. acknowledge support from the Department of Energy (grant no. DE-FG07-ER46426). A.G.C. acknowledges the support of a Marie Curie International Outgoing Fellowship. G.J.Y and X.H.C acknowledge the support from Strategic Priority Research Program (B) of the Chinese Academy of Sciences and the National Basic Research Program of China (973 Program).
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H.T.Y., H.Y.H. and Y.C. conceived and designed the experiments. H.T.Y. performed sample fabrication and transport measurements. H.T.Y., X.G.L., F.A., A.G.C. and M.B. performed optical measurements. W.L. and Z.X.S. performed ARPES measurement. G.X., B.L. and S.C.Z. performed DFT calculations and theoretical analyses. X.G.L. performed the band bending calculation. J.S. performed transmission electron microscopy analysis. G.J.Y and X.H.C. grew the high-quality BP crystals. Y.H., M.B., Z.X.S., S.C.Z., X.H.C., H.Y.H. and Y.C. supervised the project and all authors contributed to data discussions. H.T.Y. wrote the manuscript, with input from all authors.
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Yuan, H., Liu, X., Afshinmanesh, F. et al. Polarization-sensitive broadband photodetector using a black phosphorus vertical p–n junction. Nature Nanotech 10, 707–713 (2015). https://doi.org/10.1038/nnano.2015.112
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DOI: https://doi.org/10.1038/nnano.2015.112
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