Focus
Oxide interfaces
- Focus issue:
- February 2012 Volume 11, No 2
Oxide materials show an amazing variety of electronic and ionic phenomena. In this focus issue we review the progress in oxide thin film technology and highlight the outstanding challenges for the fundamental understanding and practical implementation of complex oxides in devices.
Editorial
The interface is still the device - p91
doi:10.1038/nmat3244
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Commentary
Whither the oxide interface - pp92–94
J. Chakhalian, A. J. Millis & J. Rondinelli
doi:10.1038/nmat3225
Full text - Whither the oxide interface | PDF (800 KB) - Whither the oxide interface
Review
Emergent phenomena at oxide interfaces - pp103–113
H. Y. Hwang, Y. Iwasa, M. Kawasaki, B. Keimer, N. Nagaosa & Y. Tokura
doi:10.1038/nmat3223
Full text - Emergent phenomena at oxide interfaces | PDF (1.63 MB) - Emergent phenomena at oxide interfaces
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