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A low-cost non-toxic post-growth activation step for CdTe solar cells

Abstract

Cadmium telluride, CdTe, is now firmly established as the basis for the market-leading thin-film solar-cell technology. With laboratory efficiencies approaching 20 per cent1, the research and development targets for CdTe are to reduce the cost of power generation further to less than half a US dollar per watt (ref. 2) and to minimize the environmental impact. A central part of the manufacturing process involves doping the polycrystalline thin-film CdTe with CdCl2. This acts to form the photovoltaic junction at the CdTe/CdS interface3,4 and to passivate the grain boundaries5, making it essential in achieving high device efficiencies. However, although such doping has been almost ubiquitous since the development of this processing route over 25 years ago6, CdCl2 has two severe disadvantages; it is both expensive (about 30 cents per gram) and a water-soluble source of toxic cadmium ions, presenting a risk to both operators and the environment during manufacture. Here we demonstrate that solar cells prepared using MgCl2, which is non-toxic and costs less than a cent per gram, have efficiencies (around 13%) identical to those of a CdCl2-processed control group. They have similar hole densities in the active layer (9 × 1014 cm−3) and comparable impurity profiles for Cl and O, these elements being important p-type dopants for CdTe thin films. Contrary to expectation, CdCl2-processed and MgCl2-processed solar cells contain similar concentrations of Mg; this is because of Mg out-diffusion from the soda-lime glass substrates and is not disadvantageous to device performance. However, treatment with other low-cost chlorides such as NaCl, KCl and MnCl2 leads to the introduction of electrically active impurities that do compromise device performance. Our results demonstrate that CdCl2 may simply be replaced directly with MgCl2 in the existing fabrication process, thus both minimizing the environmental risk and reducing the cost of CdTe solar-cell production.

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Figure 1: J–V and EQE analysis of cells with different chloride treatments.
Figure 2: Capacitance voltage profiling of carrier concentration.
Figure 3: SIMS profiles of CdTe films.

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Acknowledgements

We thank T. Veal for assistance in manuscript preparation and the Engineering and Physical Sciences Research Council for funding support.

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Authors and Affiliations

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Contributions

J.D.M. and R.E.T. conceived the experiments. J.D.M. fabricated and tested the solar-cell devices. L.J.P. performed C–V measurements. J.D.M. and K.D. discussed the results and prepared the manuscript.

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Correspondence to J. D. Major.

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The authors declare no competing financial interests.

Extended data figures and tables

Extended Data Figure 1 J–V–T data for cells with various chloride treatments.

Current density versus voltage curves measured as a function of temperature (J–V–T) with inset back-contact barrier height values ϕb, determined for the highest-efficiency contacts for: the CdCl2-treated device (a), the MgCl2-vapour-treated device (b), the NaCl-treated device (c) and the high-efficiency cell (see Extended Data Fig. 3) treated with a 1 M MgCl2/H2O solution and addition of 2 nm Cu to the back contact (d). Values for the back-contact barrier height are extracted by fitting to the temperature dependence of the series resistance Rs (see Methods).

Extended Data Figure 2 Stability measurements for CdCl2- and MgCl2-treated cells.

J–V curves for devices treated with the MgCl2 vapour process (a) and the CdCl2 treatment (b). J–V curves were measured immediately after processing and then after 6 months of storage under ambient conditions. Performance degradation over the 6-month period was assessed from the average shift in efficiency, fill factor, short circuit current density Jsc and open circuit voltage Voc for nine contacts over this period. The averages for the ratio of initial and final performances, along with the associated error, are given for the MgCl2 vapour treatment (c) and the CdCl2 treatment (d).

Extended Data Figure 3 High-efficiency MgCl2-treated devices.

Performance of CdTe devices treated with MgCl2 is further improved following device optimization and the use of a 1 M MgCl2/H2O solution. A 2-nm Cu layer is added to the back contact, the ZnO buffer layer is replaced with a nanostructured CdS:O layer and CdS thickness is reduced to about 40 nm. a, J–V curves for the unimproved MgCl2-vapour-treated device (13.5%), and the improved cell treated with MgCl2/H2O solution (15.7%). b, EQE curves for the same devices, showing minimised CdS/ZnO cut-off at short wavelength (300–525 nm) by use of CdS:O layer. c, Extracted device performance parameters from J–V data.

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Major, J., Treharne, R., Phillips, L. et al. A low-cost non-toxic post-growth activation step for CdTe solar cells. Nature 511, 334–337 (2014). https://doi.org/10.1038/nature13435

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