FIGURE 1. The band structure of a silicon-on-insulator membrane.
From the following article:
Semiconductor physics: Transport news
John J. Boland
Nature 439, 671-673 (9 February 2006)
doi:10.1038/439671a

Trap states (short lines) at the silicon–silicon-dioxide interface in Zhang and colleagues' thin silicon membrane1 depress the Fermi energy (EF) of the membrane to below its intrinsic level (Ei), hindering conduction. But surface effects create allowed energy states (yellow) just above the valence band, into which electrons (blue circles) can be excited thermally, producing 'holes' (white circles) that can propagate through the valence band. This surface effect in silicon works equivalently to the doping effect in bulk silicon in enhancing the material's conduction properties. (Adapted from ref. 1.)
