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Letters to Nature
Nature 435, 78-81 (5 May 2005) | doi:10.1038/nature03516; Received 29 October 2004; Accepted 4 March 2005
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Assistant Professor in Pharmacology
- St. George University
- Grenada, West Indies
Beamline Scientist Soft X-ray Microscopy
- Synchrotron SOLEIL
- Gif Sur Yvette 91190 France
Measurement of femtometre-scale atomic displacements by X-ray absorption spectroscopy
Robert F. Pettifer1, Olivier Mathon2, Sakura Pascarelli2, Michael D. Cooke3,4 & Michael R. J. Gibbs3
- Department of Physics, University of Warwick, Coventry CV4 7AL, UK
- European Synchrotron Radiation Facility (ESRF), BP 220, 38043 Grenoble Cedex 9, France
- Department of Engineering Materials, Sir Robert Hadfield Building, Mappin Street, University of Sheffield, Sheffield S1 3JD, UK
- *Present address: School of Engineering, University of Durham, Durham DH1 3LE, UK
Correspondence to: Robert F. Pettifer1 Correspondence and requests for materials should be addressed to R.F.P. (Email: r.pettifer@warwick.ac.uk).
Abstract
The frequencies of extended X-ray absorption fine-structure (EXAFS)1 measurements, which are oscillations occurring on the high-energy side of an X-ray absorption edge, can be used to identify interatomic distances in materials. We have used a dispersive X-ray spectrometer2, 3, 4, 5, which has no moving components, to make rapid measurements with minimal energy drift of the difference in EXAFS from the Fe K edge in an iron-cobalt thin film undergoing periodic strain through magnetostriction6, 7. We show that magnetostriction can be detected by differential X-ray absorption. The magnitude of the recorded signal relative to the noise shows a sensitivity to mean differential atomic motion of one femtometre: a factor of 100 times more sensitive than that normally available8, 9.
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