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Electron microscopy image enhanced

Nature volume 392, pages 768–769 (1998)Cite this article

Abstract

One of the biggest obstacles in improving the resolution of the electron microscope has always been the blurring of the image caused by lens aberrations. Here we report a solution to this problem for a medium-voltage electron microscope which gives a stunning enhancement of image quality.

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Figure 1: Diffractogram tableau of the microscope.
Figure 2: Structure images of an epitaxial Si(111) CoSi2 interface demonstrating the production of image artefacts by the effect of con.

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Author notes

  1. Maximilian Haider & Stephan Uhlemann

    Present address: CEOS GmbH, Im Neuenheimer Feld 519, 69120, Heidelberg, Germany

Authors and Affiliations

  1. European Molecular Biology Laboratory, Postfach 102209, 69012, Heidelberg, Germany

    Maximilian Haider, Stephan Uhlemann & Eugen Schwan

  2. Institut für Angewandte Physik, Technische Hochschule Darmstadt, 64289, Darmstadt, Germany

    Harald Rose

  3. Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, 52425, Jülich, Germany

    Bernd Kabius & Knut Urban

Authors
  1. Maximilian Haider
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  2. Stephan Uhlemann
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  3. Eugen Schwan
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  4. Harald Rose
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  5. Bernd Kabius
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  6. Knut Urban
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Cite this article

Haider, M., Uhlemann, S., Schwan, E. et al. Electron microscopy image enhanced. Nature 392, 768–769 (1998). https://doi.org/10.1038/33823

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