The atomic force microscope has recently been the subject of a series of exciting developments. The latest advance shows that this instrument can measure the charge state of an individual atom.
This is a preview of subscription content, access via your institution
Access options
Subscribe to this journal
Receive 12 print issues and online access
$259.00 per year
only $21.58 per issue
Buy this article
- Purchase on Springer Link
- Instant access to full article PDF
Prices may be subject to local taxes which are calculated during checkout
References
Binnig, G., Quate, C. F. & Gerber, Ch. Phys. Rev. Lett. 56, 930–933 (1986).
Schönenberger, C. & Alvarado, S. F. Phys. Rev. Lett. 65, 3162–3164 (1990).
Gross, L. et al. Science 324, 1428–1431 (2009).
Sugimoto, Y. et al. Nature 446, 64–67 (2007).
Sugimoto, Y. et al. Nature Mater. 4, 156–159 (2005).
Sugimoto, Y. et al. Science 322, 413–417 (2008).
Kaiser, U., Schwarz, A. & Wiesendanger, R. Nature 446, 522–525 (2007).
Ternes, M., Lutz, C. P., Hirjibehedin, C. F., Giessibl, F. J. & Heinrich, A. J. Science 319, 1066–1069 (2008).
Albers, B. J. et al. Nature Nanotech. 4, 307–310 (2009).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Schwarz, U. On the charge. Nature Nanotech 4, 477–478 (2009). https://doi.org/10.1038/nnano.2009.215
Issue Date:
DOI: https://doi.org/10.1038/nnano.2009.215
