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ORGANIC SEMICONDUCTORS

Little probe, big data

Nature Materials volume 18, pages 776–777 (2019)Cite this article

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Thousands of electron diffraction patterns, collected stepwise by scanning transmission electron microscopy, are synchronized and mined to provide unprecedented maps of the nanostructure of ordered domains in organic electronics films.

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Fig. 1: The 4D-STEM principle.

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Authors and Affiliations

  1. Department of Materials Science and Engineering, Technion — Israel Institute of Technology, Haifa, Israel

    Gitti L. Frey

  2. Electron Microscopy Center, Department of Materials Science and Engineering, Technion — Israel Institute of Technology, Haifa, Israel

    Yaron Kauffmann

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  1. Gitti L. Frey
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  2. Yaron Kauffmann
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Correspondence to Gitti L. Frey or Yaron Kauffmann.

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Frey, G.L., Kauffmann, Y. Little probe, big data. Nat. Mater. 18, 776–777 (2019). https://doi.org/10.1038/s41563-019-0413-5

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