Abstract
INTENSITY changes in X-radiation diffracted by single crystals excited in different vibrational modes have been observed by X-ray topography1,2. Published topographs show the intensity distribution of X-rays diffracted by definite crystallographic planes as predicted by the Bragg condition. The photographic image intensity depends on the quality of a stationary single crystal; with a vibrating single crystal the vibrational mode may also be determined.
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SEDLÁKOVÁ, L., MICHALEC, R., MIKULA, P. et al. Neutron Topography of Vibrating Single Crystals of α-SiO2. Nature Physical Science 242, 109–110 (1973). https://doi.org/10.1038/physci242109a0
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DOI: https://doi.org/10.1038/physci242109a0