Abstract
The resolution that may be achieved with an electron microscope can be improved by increasing the accelerating voltage, provided that the electrical and mechanical design is of a sufficiently high standard to realise the theoretical performance1,2. Several such microscopes have been constructed in recent years3–5 and have produced images containing information which can be interpreted directly to a higher resolution than any yet obtained at 100 kV (refs 6, 7). The Cambridge University 600-kV high resolution electron microscope is now yielding high quality micrographs with directly interpretable resolution approaching 0.2 nm. We describe here some of the novel features of this microscope and give some measurements which establish its electron-optical performance. We also show some examples of recent observations which demonstrate the benefits of its atomic resolving power. A more detailed description of the instrument and more references are given elsewhere2,8.
This is a preview of subscription content, access via your institution
Access options
Subscribe to this journal
Receive 51 print issues and online access
$199.00 per year
only $3.90 per issue
Buy this article
- Purchase on Springer Link
- Instant access to full article PDF
Prices may be subject to local taxes which are calculated during checkout
Similar content being viewed by others
References
Herrmann, K-H. J. Phys. E11, 1076–1091 (1978).
Nixon, W. C. et al. in Developments in Electron Microscopy and Analysis, 1977 (ed. Misell, D. L.) 13–16 (Institute of Physics, Bristol, 1977).
Kobayashi, K. et al. in Proc. Eighth Int. EM Cong. 1974 Vol. 1 (eds Sanders, J. V. & Goodchild, D. J.) 30–31 (Australian Academy of Science, Canberra, 1974).
Horiuchi, S., Matsui, Y., Bando, Y., Katsuta, T. & Matsui, I. J. Electron Microsc. 27, 39–48 (1978).
Dietrich, I. et al. Ultramicroscopy 2, 241–249 (1977).
Krivanek, O. L., Isoda, S. & Kobayashi, K. Phil. Mag. 36, 931–940 (1977).
Horiuchi, S., Kikuchi, T. & Goto, M. Acta crystallogr. A33, 701–703 (1977).
Cosslett, V. E. in Proc. Fifth Int. Conf. HVEM, 1977 (eds Imura, T. & Hashimoto, H.) 87–90 (Japanese Society for Electron Microscopy, Kyoto 1977).
Ahmed, H. & Broers, A. N. J. appl. Phys. 43, 2185–2192 (1972).
Ahmed, H. Proc. Fifth Eur. Congr. on EM 10–11 (Institute of Physics, Bristol, 1972).
Krivanek, O. L., Isoda, S. & Kobayashi, K. J. Microsc. 111, 279–282 (1977).
Riecke, W. D. & Ruska, E. Sixth Int. Congr. for EM Vol. 1 (ed. Uyeda, R.) 19–20 (Maruzen, Tokyo 1966).
Cleaver, J. R. A. Optik 48, 95–118 (1977); 49, 413–431 (1978).
Reinhold, G. & Gleyvod, R. in High Voltage Electron Microscopy (eds Swann, P. R., Humphreys, C. J. & Goringe, M. J.) 93–97 (Academic, London, 1974).
Saxton, W. O., Homer, M. & Pitt, A. J. Ultramicroscopy (in the press).
Bursill, L. A. & Wood, G. J. Phil. Mag. A38, 673–689 (1978).
Bourret, A., Desseaux, J. & Renault, A. Acta crystallogr. A31, 746–752 (1975).
Iijima, S. J. appl. Phys. 42, 5891–5893 (1971).
Horiuchi, S., Matsui, Y. & Bando, Y. Jap. J. appl. Phys. 15, 2483–2484 (1976).
Jefferson, D. A. et al. Nature this issue (1979).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Cosslett, V., Camps, R., Saxton, W. et al. Atomic resolution with a 600-kV electron microscope. Nature 281, 49–51 (1979). https://doi.org/10.1038/281049a0
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1038/281049a0
This article is cited by
-
Atomic resolution electron microscopy of small metal clusters
Zeitschrift f�r Physik D Atoms, Molecules and Clusters (1991)
-
Molecular detail in electron micrographs of polymer crystals
Journal of Materials Science Letters (1985)
-
Radiation damage and high resolution electron microscopy of polydiacetylene crystals
Journal of Materials Science (1984)
-
Molecular detail in electron micrographs of quaterrylene C40H20
Nature (1981)
-
Direct observation of the structure of a metallic alloy glass
Nature (1979)
Comments
By submitting a comment you agree to abide by our Terms and Community Guidelines. If you find something abusive or that does not comply with our terms or guidelines please flag it as inappropriate.