Abstract
WE report here the successful high resolution of organic material by electron microscopy, a technique extremely sensitive to electron irradiation. As is well known, an inevitable factor that limits such high resolution microscopy is severe radiation damage, and, therefore, the electron beam must be reduced very much below the critical dose to prevent higher order details from fading. As a result, one cannot get high contrast by using the usual films, and we used an X-ray film (Ilford, Industrial G) with a high quantum efficiency. With this film, the exposure time did not exceed 5–7 s in conditions of minimal beam irradiation (Williams et al.1).
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References
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MURATA, Y., FRYER, J. & BAIRD, T. High resolution image of copper phthalocyanine. Nature 263, 401–402 (1976). https://doi.org/10.1038/263401b0
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DOI: https://doi.org/10.1038/263401b0
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