Abstract
THE preferred ion source for use in analytical mass spectrography is the spark source in its various forms such as the r.f. spark or the low voltage discharge, but some attention has been devoted in recent years to the possibility of using a focused laser beam to produce ions from the analytical sample1,2. The advantage of using such a system lies in its ability to vaporize and ionize non-conducting samples.
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References
Honig, R. E., and Woolston, J. J. R., Appl. Phys. Lett., 2, 138 (1963).
Honig, R. E., Applications of Mass Spectroscopy to the Analysis of Solids: a Review in Recent Developments in Mass Spectroscopy—Proc. Intern. Conf. Mass Spectrosc., Kyoto, 1969 (University Park Press, Tokyo, 1970).
Franzen, J., and Schuy, K. D., Z. Anal. Chem., 225, 295 (1967).
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SCOTT, R., JACKSON, P. & STRASHEIM, A. Application of Laser Source Mass Spectroscopy to Analysis of Geological Material. Nature 232, 623–624 (1971). https://doi.org/10.1038/232623a0
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DOI: https://doi.org/10.1038/232623a0
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