Abstract
SINCE the pioneering work of Marshall and Forrest1, many further attempts have been made to control the voltage distribution over the surface of ceramic insulators by incorporating a conducting system in the glaze layer to allow a small leakage current to flow through it; recent progress in this field has been reviewed in papers by Forrest et al.2,3. Lucas4 and Smith5, of this laboratory, have shown that the major disadvantage of the semiconducting compounds (commonly metal oxides) used to achieve the preferred value of resistivity, between 7 and 17 MΩ/sq., is their susceptibility to damage by electrolytic corrosion in polluted atmospheres. The purpose of this communication is to describe two new conducting coating systems which show some promise of possessing increased resistance to corrosion. They are glazes containing dispersions of carbon and glazes carrying a film deposited by vacuum evaporation of silicon carbide.
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References
Marshall, C. W., and Forrest, J. S., Birt. Pat. No. 527,357 (1939).
Forrest, J. S., Brit. J. App. Phys., Supp. No. 2, 37 (1953).
Forrest, J. S., Lambeth, P. J., and Oakeshott, D. F., Proc. Inst. Elec. Eng., 107, A, 172 (1960).
Lucas, D. H., Brit. J. App. Phys., 3, 293 (1952).
Smith, E. J. D., Trans. Brit. Ceram. Soc., 58, 5 (1959).
Drowart, J., de Maria, G., and Inghram, M. G., J. Chem. Phys., 30, 308 (1959).
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SANDERS, R., HOLMES, D. Conducting Coatings for High-Voltage Insulator Stabilization. Nature 195, 170–171 (1962). https://doi.org/10.1038/195170a0
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DOI: https://doi.org/10.1038/195170a0
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